A compression and transmission method for surveillance video data using SPICE protocol and DWT in cloud desktop environment. IEEE Trans Very Large Scale Integration (VLSI) Syst 18(8):1220–1224 Lin CY, Lin HC, Chen HM (2010) On reducing test power and test volume by selective pattern compression schemes. IEEE Trans Comput Aided Des Integr Circuits Syst 31(4):644–648 Lee LJ, Tseng WD, Lin RB, Chang CH (2012) $2^ $ pattern run-length for test data compression. IEEE Trans Comput Aided Des Integr Circuits Syst 26(2):396–401 Lee J, Touba NA (2007) LFSR-reseeding scheme achieving low-power dissipation during test. IEEE Trans Very Large Scale Integration (VLSI) Syst 16(7):926–931. Kavousianos X, Kalligeros E, Nikolos D (2008) Multilevel-Huffman test-data compression for IP cores with multiple scan chains. Kasban H, Hashima S (2019) Adaptive radiographic image compression technique using hierarchical vector quantization and Huffman encoding. IEEE Trans Comput Aided Des Integr Circuits Syst 22(6):797–806 Jas A, Ghosh-Dastidar J, Ng ME, Touba NA (2003) An efficient test vector compression scheme using selective Huffman coding. IEEE Trans Comput Aided Des Integr Circuits Syst 22(6):783–796 Gonciari PT, Al-Hashimi BM, Nicolici N (2003) Variable-length input Huffman coding for system-on-a-chip test. In: Proceedings of the conference on design, automation and test in Europe (pp. ![]() Gonciari P, Al-Hashimi B, Nicolici N (2002) Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression. J Ambient Intell Human Comput 10(7):2745–2756Įl-Maleh AH (2008) Test data compression for system-on-a-chip using extended frequency-directed run-length code. ![]() IEEE Trans Comput Aided Des Integr Circuits Syst 28(11):1742–1755ĭi Martino F, Sessa S (2019) Multi-level fuzzy transforms image compression. IEEE Trans Comput 52(8):1076–1088Ĭzysz D, Kassab M, Lin X, Mrugalski G, Rajski J, Tyszer J (2009) Low-power scan operation in test compression environment. IEEE Trans Comput Aided Des Integr Circuits Syst 22(3):352–363Ĭhandra A, Chakrabarty K (2003b) Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. ACM.Ĭhandra A, Chakrabarty K (2003a) A unified approach to reduce SOC test data volume, scan power and testing time. In: Proceedings of the 39th annual design automation conference (pp. IEEE Trans Comput Aided Des Integr Circuits Syst 20(3):355–368Ĭhandra A, Chakrabarty K (2002) Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. Further, itlays only soft burden on the hardware.Ĭhandra A, Chakrabarty K (2001) System-on-a-chip test-data compression and decompression architectures based on Golomb codes. ![]() The experimental results on large benchmark circuits like ITC’99 and ISCAS’99 proves that the proposed D&C lossless compression attains reduced testing time and better compression ratio. Further, the decompression is attained using advanced Finite State Machine (FSM) to reduce overhead. The Discrete Cosine Transform (DCT) manipulates each data bit inside file and this reduces the file size without any data loss after decoding to lossless compression.Depending on the data characteristic, the compression of data is done without any loss in data. This framework of D&C lossless compression coder combines the lossless and lossy compression methods. A new test compression method called divide and compress (D&C) lossless compression coder with Discrete Cosine Transformis used to enhance the compression capability. To reduce the testing time and addresses the problem related to high overhead, high fault coverage andincreased power dissipationmethod is used in system-on-chip (SoC). This challenge leads to higher computational complexity associated with the testing circuits. ![]() The increasing test data volume is considered as a biggest challenge in circuit under test.
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |